smartctl 5.41 2011-06-09 r3365 [i686-linux-3.10.27] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     HGST HCC541010A9E630
Serial Number:    JDD030CH2Z0YEJ
LU WWN Device Id: 5 000cca 79ae9d5b4
Firmware Version: JA0OA740
User Capacity:    1,000,204,886,016 bytes [1.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Tue Dec 30 15:29:48 2025 AEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(   45) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 239) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   062    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   100   100   040    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0007   113   113   033    Pre-fail  Always       -       2
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       150
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   040    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0012   001   001   000    Old_age   Always       -       69721
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       150
191 G-Sense_Error_Rate      0x000a   100   100   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       143
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       151
194 Temperature_Celsius     0x0002   214   214   000    Old_age   Always       -       28 (Min/Max 9/42)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0
223 Load_Retry_Count        0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 154 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 154 occurred at disk power-on lifetime: 1824 hours (76 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 20 8f 6d 70 04  Error: UNC 32 sectors at LBA = 0x04706d8f = 74476943

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 20 8f 6d 70 e0 00   1d+09:39:07.985  READ DMA EXT
  25 00 01 af 6d 70 e0 00   1d+09:39:07.949  READ DMA EXT
  25 00 20 02 00 00 e0 00   1d+09:39:07.949  READ DMA EXT
  25 00 01 01 00 00 e0 00   1d+09:39:07.949  READ DMA EXT
  25 00 01 00 00 00 e0 00   1d+09:39:07.919  READ DMA EXT

Error 153 occurred at disk power-on lifetime: 1824 hours (76 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 88 82 b6 03  Error: UNC 16 sectors at LBA = 0x03b68288 = 62292616

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 10 88 82 b6 e0 00   1d+09:38:10.795  READ DMA EXT
  25 00 08 48 81 b6 e0 00   1d+09:38:10.763  READ DMA EXT
  25 00 20 00 80 b9 e0 00   1d+09:38:10.763  READ DMA EXT
  25 00 00 00 7c b9 e0 00   1d+09:38:10.762  READ DMA EXT
  25 00 00 00 74 b9 e0 00   1d+09:38:10.761  READ DMA EXT

Error 152 occurred at disk power-on lifetime: 1824 hours (76 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 da b8 03  Error: UNC at LBA = 0x03b8da00 = 62446080

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 00 d8 b8 e0 00   1d+09:38:02.198  READ DMA EXT
  25 00 08 00 c8 b8 e0 00   1d+09:38:02.176  READ DMA EXT
  25 00 08 08 c8 b8 e0 00   1d+09:38:02.165  READ DMA EXT
  25 00 08 10 c8 b8 e0 00   1d+09:38:02.076  READ DMA EXT
  25 00 08 18 c8 b8 e0 00   1d+09:38:01.976  READ DMA EXT

Error 151 occurred at disk power-on lifetime: 1824 hours (76 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 40 cc b8 03  Error: UNC 8 sectors at LBA = 0x03b8cc40 = 62442560

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 40 cc b8 e0 00   1d+09:37:53.654  READ DMA EXT
  25 00 08 48 cc b8 e0 00   1d+09:37:53.543  READ DMA EXT
  25 00 08 50 cc b8 e0 00   1d+09:37:53.454  READ DMA EXT
  25 00 08 58 cc b8 e0 00   1d+09:37:53.420  READ DMA EXT
  25 00 08 60 cc b8 e0 00   1d+09:37:53.387  READ DMA EXT

Error 150 occurred at disk power-on lifetime: 1824 hours (76 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 c8 cc b8 03  Error: UNC 8 sectors at LBA = 0x03b8ccc8 = 62442696

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 c8 cc b8 e0 00   1d+09:37:51.944  READ DMA EXT
  25 00 08 d0 cc b8 e0 00   1d+09:37:51.844  READ DMA EXT
  25 00 08 d8 cc b8 e0 00   1d+09:37:51.811  READ DMA EXT
  25 00 08 e0 cc b8 e0 00   1d+09:37:51.788  READ DMA EXT
  25 00 08 e8 cc b8 e0 00   1d+09:37:51.700  READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

